3238 search results - page 296 / 648 » Multi-return function call |
109
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ICDE
2010
IEEE
16 years 2 months ago
2010
IEEE
Testing and debugging database software is often challenging and time consuming. A very arduous task for DB testers is finding a min-repro ? the "simplest possible setup"...
115
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CVPR
2009
IEEE
15 years 12 months ago
2009
IEEE
Consider a projector-camera setup where a sinusoidal pattern is projected onto the scene, and an image of the objects imprinted with the pattern is captured by the camera. In this...
124
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ICWS
2009
IEEE
15 years 11 months ago
2009
IEEE
Algorithms for composing Web services (WS) traditionally utilize the functional and quality-of-service parameters of candidate services to decide which services to include in the ...
142
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ICCD
2003
IEEE
15 years 11 months ago
2003
IEEE
Continued advancements in fabrication technology and reductions in feature size create challenges in maintaining both manufacturing yield rates and long-term reliability of device...
120
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ICCD
2002
IEEE
15 years 11 months ago
2002
IEEE
— In this paper, we present a new interconnect delay model called Fitted Elmore delay (FED). FED is generated by approximating Hspice delay data using a curve fitting technique....