2072 search results - page 42 / 415 » Multibook's test environment |
149
Voted
ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
This paper describes a Hybrid DFT (H-DFT) architecture for low-cost, high quality structural testing in the high volume manufacturing (HVM) environment. This structure efficiently...
160
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ERSA
2010
15 years 3 months ago
2010
Abstract--Modeling environments and performance prediction boost application productivity, but often lack integration into an efficient and comprehensive approach to strategic desi...
141
Voted
DATE
2009
IEEE
16 years 3 days ago
2009
IEEE
Scan compression has emerged as the most successful solution to solve the problem of rising manufacturing test cost. Compression technology is not hierarchical in nature. Hierarch...
146
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VTS
1997
IEEE
15 years 9 months ago
1997
IEEE
We describe a technique to generate critical hazard-free tests for self-timed control circuits build using a macromodule library, in a partial scan based DFT environment. Wepropos...
157
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CORR
2002
Springer
15 years 5 months ago
2002
Springer
Abstract. We present GUPU, a side-effect free environment specialized for programming courses. It seamlessly guides and supports students during all phases of program development, ...