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XPU
2004
Springer
15 years 10 months ago
Suitability of FIT User Acceptance Tests for Specifying Functional Requirements: Developer Perspective
Abstract. The paper outlines an experiment conducted in two different academic environments, in which FIT tests were used as a functional requirements specification. Common challen...
Grigori Melnik, Kris Read, Frank Maurer
ISESE
2006
IEEE
15 years 11 months ago
An empirical evaluation of a testing and debugging methodology for Excel
Spreadsheets are one of the most commonly used types of programs in the world, and it is important that they be sufficiently dependable. To help end users who create spreadsheets ...
Jeffrey Carver, Marc Fisher II, Gregg Rothermel
DATE
2003
IEEE
104views Hardware» more  DATE 2003»
15 years 10 months ago
A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories
In this paper we present a microprocessor-based approach suitable for embedded flash memory testing in a System-on-achip (SOC) environment. The main novelty of the approach is the...
Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza ...
AIEDU
2006
73views more  AIEDU 2006»
15 years 5 months ago
Using Knowledge Tracing in a Noisy Environment to Measure Student Reading Proficiencies
Constructing a student model for language tutors is a challenging task. This paper describes using knowledge tracing to construct a student model of reading proficiency and validat...
Joseph E. Beck, June Sison
ICCAD
2008
IEEE
105views Hardware» more  ICCAD 2008»
16 years 2 months ago
Temperature-aware test scheduling for multiprocessor systems-on-chip
—Increasing power densities due to process scaling, combined with high switching activity and poor cooling environments during testing, have the potential to result in high integ...
David R. Bild, Sanchit Misra, Thidapat Chantem, Pr...