2072 search results - page 59 / 415 » Multibook's test environment |
158
click to vote
MKWI
2008
15 years 7 months ago
2008
: Along with rapidly changing market requirements for service-oriented business software new challenges for quality management, quality assurance, and testing arise. Customers must...
195
click to vote
ECBS
2010
IEEE
15 years 8 months ago
2010
IEEE
Model-based selective regression testing promises reduction in cost and labour by selecting a subset of the test suite corresponding to the modifications after system evolution. H...
163
click to vote
ICMCS
2006
IEEE
15 years 11 months ago
2006
IEEE
In this work, we develop a hierarchical load testing architecture using large scale virtual clients to reduce the testing time and ensure the stability of the server for distribut...
167
click to vote
DATE
2003
IEEE
15 years 10 months ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
126
click to vote
DATE
2004
IEEE
15 years 9 months ago
2004
IEEE
In this paper we describe how we applied a BIST-based approach to the test of a logic core to be included in System-on-achip (SoC) environments. The approach advantages are the ab...