395 search results - page 16 / 79 » Multilevel Circuit Partitioning |
DAC
2003
ACM
15 years 10 months ago
2003
ACM
Combinational circuits are generally thought of as acyclic structures. It is known that cyclic structures can be combinational, and techniques have been proposed to analyze cyclic...
70
Voted
ICCAD
1996
IEEE
15 years 1 months ago
1996
IEEE
A new method is presented to compute the exact observability don't cares (ODC) for multilevel combinational circuits. A new mathematical concept, called polarization, is intr...
83
Voted
DAC
1994
ACM
15 years 1 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
EAAI
2007
14 years 9 months ago
2007
This paper presents a swarm intelligence based approach to optimally partition combinational CMOS circuits for pseudoexhaustive testing. The partitioning algorithm ensures reducti...
JISE
2000
14 years 9 months ago
2000
We present an algorithm for identifyinga set of faults that do not have to be targeted by a sequential delay fault test generator. These faults either cannot independently aect th...