This paper presents a technique for creating a smooth, closed surface from a set of 2D contours, which have been extracted from a 3D scan. The technique interprets the pixels that...
Ilya Braude, Jeffrey Marker, Ken Museth, Jonathan ...
NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...
A new method for hierarchical fault simulation based on multi-level Decision Diagrams (DD) is proposed. We suppose that a register transfer (RT) level information along with gate-...