234 search results - page 8 / 47 » Multiple Faults: Modeling, Simulation and Test |
IOLTS
2002
IEEE
15 years 2 months ago
2002
IEEE
A silicon independent C-Based model of the TTP/C protocol was implemented within the EU-founded project FIT. The C-based model is integrated in the C-Sim simulation environment. T...
ITC
1991
IEEE
15 years 1 months ago
1991
IEEE
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...
86
Voted
IM
2003
14 years 10 months ago
2003
Abstract: A probabilistic event-driven fault localization technique is presented, which uses a symptom-fault map as a fault propagation model. The technique isolates the most proba...
CN
2004
14 years 9 months ago
2004
This paper presents a probabilistic event-driven fault localization technique, which uses a probabilistic symptomfault map as a fault propagation model. The technique isolates the...
121
Voted
GLVLSI
2009
IEEE
14 years 7 months ago
2009
IEEE
To assist in dynamic assertion-based verification, we present a method to automatically build a test vector generator from a temporal property. Based on the duality between monito...