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ICCAD
2009
IEEE
118views Hardware» more  ICCAD 2009»
15 years 24 days ago
Characterizing within-die variation from multiple supply port IDDQ measurements
-- The importance of within-die process variation and its impact on product yield has increased significantly with scaling. Within-die variation is typically monitored by embedding...
Kanak Agarwal, Dhruva Acharyya, Jim Plusquellic
KDD
1998
ACM
123views Data Mining» more  KDD 1998»
15 years 7 months ago
Scaling Clustering Algorithms to Large Databases
Practical clustering algorithms require multiple data scans to achieve convergence. For large databases, these scans become prohibitively expensive. We present a scalable clusteri...
Paul S. Bradley, Usama M. Fayyad, Cory Reina
DATE
2004
IEEE
136views Hardware» more  DATE 2004»
15 years 6 months ago
Data Windows: A Data-Centric Approach for Query Execution in Memory-Resident Databases
Structured embedded databases are currently becoming an integrated part of embedded systems, thus, enabling higher standards in system automation. These embedded databases are typ...
Jayaprakash Pisharath, Alok N. Choudhary, Mahmut T...
ICRA
2007
IEEE
127views Robotics» more  ICRA 2007»
15 years 9 months ago
Compact Tactile Display for Fingertips with Multiple Vibrotactile Actuator and Thermoelectric Module
—In this paper, a compact tactile display which consists of multiple vibrotactile actuators with 4-different vibrotactile unbalanced masses and a peltier thermoelectric module is...
Gi-Hun Yang, Tae-Heon Yang, Seung-Chan Kim, Dong-S...
CIARP
2007
Springer
15 years 9 months ago
Confusion Matrix Disagreement for Multiple Classifiers
We present a methodology to analyze Multiple Classifiers Systems (MCS) performance, using the disagreement concept. The goal is to define an alternative approach to the conventiona...
Cinthia Obladen de Almendra Freitas, João M...