-- The importance of within-die process variation and its impact on product yield has increased significantly with scaling. Within-die variation is typically monitored by embedding...
Practical clustering algorithms require multiple data scans to achieve convergence. For large databases, these scans become prohibitively expensive. We present a scalable clusteri...
Structured embedded databases are currently becoming an integrated part of embedded systems, thus, enabling higher standards in system automation. These embedded databases are typ...
Jayaprakash Pisharath, Alok N. Choudhary, Mahmut T...
—In this paper, a compact tactile display which consists of multiple vibrotactile actuators with 4-different vibrotactile unbalanced masses and a peltier thermoelectric module is...
Gi-Hun Yang, Tae-Heon Yang, Seung-Chan Kim, Dong-S...
We present a methodology to analyze Multiple Classifiers Systems (MCS) performance, using the disagreement concept. The goal is to define an alternative approach to the conventiona...