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CVPR
2004
IEEE
16 years 6 months ago
Wide Baseline Feature Matching Using the Cross-Epipolar Ordering Constraint
? Robust feature matching across different views of the same scene taken by two cameras with wide baseline and arbitrary rotation is still an open problem. Matching based on appear...
Xiaoye Lu, Roberto Manduchi
STOC
2007
ACM
71views Algorithms» more  STOC 2007»
16 years 4 months ago
Survivable network design with degree or order constraints
Lap Chi Lau, Joseph Naor, Mohammad R. Salavatipour...
DATE
2008
IEEE
84views Hardware» more  DATE 2008»
15 years 10 months ago
On the Verification of High-Order Constraint Compliance in IC Design
Jan B. Freuer, Göran Jerke, Joachim Gerlach, ...