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ASPLOS
2012
ACM
13 years 7 months ago
2012
ACM
Despite a burgeoning demand for parallel programs, the tools available to developers working on shared-memory multicore processors have lagged behind. One reason for this is the l...
DATE
2009
IEEE
15 years 6 months ago
2009
IEEE
This paper presents a novel technique for the modeling, simulation, and analysis of real-time applications on MultiProcessor Systems-on-Chip (MPSoCs). This technique is based on a...
DATE
2008
IEEE
15 years 6 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
ISORC
2008
IEEE
15 years 6 months ago
2008
IEEE
Knowing the program timing characteristics is fundamental to the successful design and execution of real-time systems. A critical timing measure is the worst-case execution time (...
DATE
2005
IEEE
15 years 5 months ago
2005
IEEE
Multi-site testing is a popular and effective way to increase test throughput and reduce test costs. We present a test throughput model, in which we focus on wafer testing, and co...