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125
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HPCA
2006
IEEE
16 years 24 days ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
191
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SIGMOD
2008
ACM
16 years 17 days ago
2008
ACM
We study the problem of querying relational data embedded in XML. Relational data can be represented by various tree structures in XML. However, current XML query methods, such as...