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INEX
2005
Springer
15 years 11 months ago
Parameter Estimation for a Simple Hierarchical Generative Model for XML Retrieval
Abstract. This paper explores the possibility of using a modified Expectation-Maximization algorithm to estimate parameters for a simple hierarchical generative model for XML retr...
Paul Ogilvie, Jamie Callan
ICST
2008
IEEE
16 years 9 days ago
Efficient Test Data Generation for Variables with Complex Dependencies
This paper introduces a new method for generating test data that combines the benefits of equivalence partitioning, boundary value analysis and cause-effect analysis. It is suitab...
Armin Beer, Stefan Mohacsi
DATE
1997
IEEE
100views Hardware» more  DATE 1997»
15 years 10 months ago
On the generation of pseudo-deterministic two-patterns test sequence with LFSRs
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
Christian Dufaza, Yervant Zorian
TC
2008
15 years 5 months ago
Low-Transition Test Pattern Generation for BIST-Based Applications
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed
AAAI
2012
13 years 8 months ago
Discriminative Clustering via Generative Feature Mapping
Existing clustering methods can be roughly classified into two categories: generative and discriminative approaches. Generative clustering aims to explain the data and thus is ad...
Liwei Wang, Xiong Li, Zhuowen Tu, Jiaya Jia