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VLSID
2009
IEEE
115views VLSI» more  VLSID 2009»
16 years 6 months ago
Efficient Techniques for Directed Test Generation Using Incremental Satisfiability
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
Prabhat Mishra, Mingsong Chen
ISW
2009
Springer
16 years 19 days ago
Nonce Generators and the Nonce Reset Problem
A nonce is a cryptographic input value which must never repeat within a given context. Nonces are important for the security of many cryptographic building blocks, such as stream c...
Erik Zenner
ISQED
2002
IEEE
203views Hardware» more  ISQED 2002»
15 years 11 months ago
Automatic Test Program Generation from RT-Level Microprocessor Descriptions
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
KBSE
2009
IEEE
16 years 24 days ago
Reggae: Automated Test Generation for Programs Using Complex Regular Expressions
Abstract—Test coverage such as branch coverage is commonly measured to assess the sufficiency of test inputs. To reduce tedious manual efforts in generating high-covering test i...
Nuo Li, Tao Xie, Nikolai Tillmann, Jonathan de Hal...
IEEECGIV
2009
IEEE
15 years 3 months ago
General Shape Grammar Interpreter for Intelligent Designs Generations
Shape grammars play an important role in a new generation of tools for the analysis and design of products. In this work we present a general tool named Shape Grammar Interpreter (...
Tomas Trescak, Inmaculada Rodríguez, Marc E...