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DELTA
2002
IEEE
15 years 9 months ago
European Network for Test Education
 The European network for Integrated Circuit testing education described in this paper addresses the shortage of skill in mixed-signal production testing by encouraging students...
Yves Bertrand, Marie-Lise Flottes, Florence Aza&iu...
ICPR
2002
IEEE
15 years 9 months ago
Contour Features for Colposcopic Image Classification by Artificial Neural Networks
This article presents colposcopic image classification based on contour parameters used in a comparison study of different artificial neural networks and the knearest neighbors re...
Isabelle Claude, Renaud Winzenrieth, Philippe Poul...
PPSN
1998
Springer
15 years 8 months ago
Integrated Facility Design Using an Evolutionary Approach with a Subordinate Network Algorithm
The facility design problem is a common one in manufacturing and service industries and has been studied extensively in the literature. However, restrictions on the scope of the de...
Bryan A. Norman, Alice E. Smith, Rifat Aykut Arapo...
ACIVS
2006
Springer
15 years 7 months ago
Context-Based Scene Recognition Using Bayesian Networks with Scale-Invariant Feature Transform
Scene understanding is an important problem in intelligent robotics. Since visual information is uncertain due to several reasons, we need a novel method that has robustness to the...
Seung-Bin Im, Sung-Bae Cho
ANSS
2001
IEEE
15 years 7 months ago
Epoch Load Sharing in a Network of Workstations
This paper examines load sharing in a network of workstations (NOW). It proposes a special load sharing method referred to as epoch load sharing. With this policy, load is evenly ...
Helen D. Karatza, Ralph C. Hilzer Jr.