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IJIS
2002
15 years 3 months ago
2002
189
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IWOCA
2010
Springer
14 years 10 months ago
2010
Springer
57
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JNIT
2010
14 years 10 months ago
2010
126
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DSD
2011
IEEE
14 years 3 months ago
2011
IEEE
100
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ITC
1989
IEEE
15 years 7 months ago
1989
IEEE
: The concept of a pseudo-exhaustive test for sequential circuits is introduced in a similar way as it is used for combinational networks. Instead of test sets one has to apply pse...