Variability in process parameters is making accurate timing analysis of nano-scale integrated circuits an extremely challenging task. In this paper, we propose a new algorithm for...
In this paper, we propose a new sensitivity based, statistical gate sizing method. Since circuit optimization effects the entire shape of the circuit delay distribution, it is dif...
Aseem Agarwal, Kaviraj Chopra, David Blaauw, Vladi...
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
This paper proposes a new clustering algorithm in the fuzzy-c-means family, which is designed to cluster time series and is particularly suited for short time series and those wit...
Background: This paper addresses key biological problems and statistical issues in the analysis of large gene expression data sets that describe systemic temporal response cascade...