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TCAD
2008
114views more  TCAD 2008»
14 years 9 months ago
Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
Zhanglei Wang, Krishnendu Chakrabarty
ICPR
2002
IEEE
15 years 10 months ago
Multibaseline Stereo in the Presence of Specular Reflections
We address the problem of accurate depth estimation using multibaseline stereo in the presence of specular reflections. Specular reflections can cause the intensity and color of c...
Yuanzhen Li, Stephen Lin, Hanqing Lu, Sing Bing Ka...
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DATE
2009
IEEE
202views Hardware» more  DATE 2009»
15 years 4 months ago
Design as you see FIT: System-level soft error analysis of sequential circuits
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
Daniel Holcomb, Wenchao Li, Sanjit A. Seshia
FGR
2008
IEEE
184views Biometrics» more  FGR 2008»
15 years 3 months ago
Multi-attribute robust facial feature localization
In this paper, we focus on the reliable detection of facial fiducial points, such as eye, eyebrow and mouth corners. The proposed algorithm aims to improve automatic landmarking ...
Oya Çeliktutan, Hatice Cinar Akakin, Bü...
BIBE
2006
IEEE
123views Bioinformatics» more  BIBE 2006»
15 years 3 months ago
Isolation and Visualization of Codon Usage Biases
While genomic sequencing projects have proved an abundant source of information for biological studies ranging from the molecular to the ecological in scale, much of the informati...
Douglas W. Raiford, Dan E. Krane, Travis E. Doom, ...