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93
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ICCAD
2003
IEEE
151views Hardware» more  ICCAD 2003»
15 years 5 months ago
On Compacting Test Response Data Containing Unknown Values
The design of a test response compactor called a Block Compactor is given. Block Compactors belong to a new class of compactors called Finite Memory Compactors. Different from spa...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Janu...
JAVACARD
2000
15 years 3 months ago
Automatic Test Generation for Java-Card Applets
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
Hugues Martin, Lydie du Bousquet
BMCBI
2010
201views more  BMCBI 2010»
14 years 9 months ago
IntelliGO: a new vector-based semantic similarity measure including annotation origin
Background: The Gene Ontology (GO) is a well known controlled vocabulary describing the biological process, molecular function and cellular component aspects of gene annotation. I...
Sidahmed Benabderrahmane, Malika Smaïl-Tabbon...
80
Voted
BMCBI
2008
133views more  BMCBI 2008»
14 years 12 months ago
ElliPro: a new structure-based tool for the prediction of antibody epitopes
Background: Reliable prediction of antibody, or B-cell, epitopes remains challenging yet highly desirable for the design of vaccines and immunodiagnostics. A correlation between a...
Julia V. Ponomarenko, Huynh-Hoa Bui, Wei Li, Nicho...
ITC
1998
IEEE
120views Hardware» more  ITC 1998»
15 years 4 months ago
Test generation in VLSI circuits for crosstalk noise
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
Weiyu Chen, Sandeep K. Gupta, Melvin A. Breuer