853 search results - page 102 / 171 » New test approach for embedded applications |
136
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ACCV
2006
Springer
15 years 5 months ago
2006
Springer
Blind blur identification in video sequences becomes more important. This paper presents a new method for identifying parameters of different blur kernels and image restoration in ...
114
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ICPR
2002
IEEE
16 years 2 months ago
2002
IEEE
The problem of geometric alignment of two roughly preregistered, partially overlapping, rigid, noisy 3D point sets is considered. A new natural and simple, robustified extension o...
102
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ICDM
2007
IEEE
15 years 7 months ago
2007
IEEE
We explore the problem of budgeted machine learning, in which the learning algorithm has free access to the training examples’ labels but has to pay for each attribute that is s...
103
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ICIP
2000
IEEE
15 years 5 months ago
2000
IEEE
This paper introduces a new classification scheme called “open-ended texture classification.” The standard approach for texture classification is to use a closed n-class cl...
128
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VMV
2004
15 years 2 months ago
2004
Visualizing iso-surfaces of volumetric data sets is becoming increasingly important for many practical applications. One crucial task in iso-surface ray tracing is to find the cor...