Sciweavers

853 search results - page 112 / 171
» New test approach for embedded applications
Sort
View
DATE
2000
IEEE
90views Hardware» more  DATE 2000»
15 years 4 months ago
Cost Reduction and Evaluation of a Temporary Faults Detecting Technique
: IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly ...
Lorena Anghel, Michael Nicolaidis
EVOW
2006
Springer
15 years 3 months ago
Artificial Life Models in Lung CTs
A new method for the analysis of 3D medical images is introduced. The algorithm is based on Biological Models of ants known as Artificial Life models. Test images (lung Computed To...
Sorin Cristian Cheran, Gianfranco Gargano
IPMI
2007
Springer
16 years 21 days ago
Active Mean Fields: Solving the Mean Field Approximation in the Level Set Framework
Abstract. We describe a new approach for estimating the posterior probability of tissue labels. Conventional likelihood models are combined with a curve length prior on boundaries,...
Kilian M. Pohl, Ron Kikinis, William M. Wells III
ICASSP
2008
IEEE
15 years 6 months ago
LSF mapping for voice conversion with very small training sets
To make voice conversion usable in practical applications, the number of training sentences should be minimized. With traditional Gaussian mixture model (GMM) based techniques sma...
Elina Helander, Jani Nurminen, Moncef Gabbouj
ICANN
2003
Springer
15 years 5 months ago
Sparse Coding with Invariance Constraints
We suggest a new approach to optimize the learning of sparse features under the constraints of explicit transformation symmetries imposed on the set of feature vectors. Given a set...
Heiko Wersing, Julian Eggert, Edgar Körner