853 search results - page 149 / 171 » New test approach for embedded applications |
106
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EURODAC
1994
IEEE
15 years 3 months ago
1994
IEEE
synchronisation also play a fundamental role in overall system robustness. ElectroMagnetic Compatibility (EMC) and ElectroMagnetic Interference (EMI) issues also have to be conside...
111
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APIN
2002
14 years 11 months ago
2002
This paper describes a new learning by example mechanism and its application for digital circuit design automation. This mechanism uses finite state machines to represent the infer...
148
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BMCBI
2011
14 years 3 months ago
2011
Background: Pairwise sequence alignment methods are widely used in biological research. The increasing number of sequences is perceived as one of the upcoming challenges for seque...
CVPR
2004
IEEE
16 years 1 months ago
2004
IEEE
We present a new approach to appearance-based object recognition, which captures the relationships between multiple model views and exploits them to improve recognition performanc...
107
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CVPR
2005
IEEE
16 years 1 months ago
2005
IEEE
We address the problem of segmenting 3D scan data into objects or object classes. Our segmentation framework is based on a subclass of Markov Random Fields (MRFs) which support ef...