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» New test approach for embedded applications
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DATE
2008
IEEE
139views Hardware» more  DATE 2008»
15 years 4 months ago
Scan Chain Organization for Embedded Diagnosis
Keeping diagnostic resolution as high as possible while maximizing the compaction ratio is subject to research since the advent of embedded test. In this paper, we present a novel...
Melanie Elm, Hans-Joachim Wunderlich
DATE
1999
IEEE
147views Hardware» more  DATE 1999»
15 years 1 months ago
Efficient BIST Hardware Insertion with Low Test Application Time for Synthesized Data Paths
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
Nicola Nicolici, Bashir M. Al-Hashimi
ICSE
2003
IEEE-ACM
15 years 9 months ago
Improving Web Application Testing with User Session Data
Web applications have become critical components of the global information infrastructure, and it is important that they be validated to ensure their reliability. Therefore, many ...
Sebastian G. Elbaum, Srikanth Karre, Gregg Rotherm...
ICST
2009
IEEE
14 years 7 months ago
A Flexible Framework for Quality Assurance of Software Artefacts with Applications to Java, UML, and TTCN-3 Test Specifications
Manual reviews and inspections of software artefacts are time consuming and thus, automated analysis tools have been developed to support the quality assurance of software artefac...
Jens Nodler, Helmut Neukirchen, Jens Grabowski
SIGMOD
2010
ACM
215views Database» more  SIGMOD 2010»
15 years 1 months ago
Dynamic symbolic database application testing
A database application differs form regular applications in that some of its inputs may be database queries. The program will execute the queries on a database and may use any re...
Chengkai Li, Christoph Csallner