853 search results - page 26 / 171 » New test approach for embedded applications |
131
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ICSE
2003
IEEE-ACM
16 years 1 months ago
2003
IEEE-ACM
Software system faults are often caused by unexpected interactions among components. Yet the size of a test suite required to test all possible combinations of interactions can be...
148
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ISSS
2000
IEEE
15 years 4 months ago
2000
IEEE
One important part of a HW/SW codesign system is the scheduler which is needed in order to determine if a given HW/SW partitioning is suitable for a given application. In this pap...
JUCS
2006
15 years 1 months ago
2006
: More than 60,000 people die suddenly each year in France due to cardiac arrhythmias. The current techniques used to diagnose cardiac arrhythmias such as HOLTER, R.TEST and teleme...
102
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DATE
2005
IEEE
15 years 7 months ago
2005
IEEE
Overheating has been acknowledged as a major issue in testing complex SOCs. Several power constrained system-level DFT solutions (power constrained test scheduling) have recently ...
119
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VTS
1999
IEEE
15 years 5 months ago
1999
IEEE
This paper presents a new technique for on-line consistency checking of embedded DRAMs. The basic idea is to use the periodic refresh operation for concurrently computing a test c...