853 search results - page 46 / 171 » New test approach for embedded applications |
ICCAD
1999
IEEE
15 years 5 months ago
1999
IEEE
Available techniques for testing core-based systems-on-a-chip (SOCs) do not provide a systematic means for synthesising low-overhead test architectures and compact test solutions....
118
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ICCAD
2010
IEEE
14 years 11 months ago
2010
IEEE
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
DAC
2001
ACM
16 years 2 months ago
2001
ACM
This paper describes the first application of the Genevieve test generation methodology. The Genevieve approach uses semi-formal techniques derived from "model-checking"...
109
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CCECE
2006
IEEE
15 years 7 months ago
2006
IEEE
The purpose of this paper is to use the aspect-oriented programming (AOP) paradigm for security testing. AOP allows security experts to develop and inject separate modules for con...
128
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CAEPIA
2011
Springer
14 years 1 months ago
2011
Springer
In this paper we apply the recent notion of anytime universal intelligence tests to the evaluation of a popular reinforcement learning algorithm, Q-learning. We show that a general...