853 search results - page 54 / 171 » New test approach for embedded applications |
140
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NIPS
2001
15 years 2 months ago
2001
Drawing on the correspondence between the graph Laplacian, the Laplace-Beltrami operator on a manifold, and the connections to the heat equation, we propose a geometrically motiva...
103
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ECRTS
1999
IEEE
15 years 5 months ago
1999
IEEE
We give timed automaton models for a class of Programmable Logic Controller (PLC) applications, that are programmed in a simple fragment of the language Instruction Lists as defin...
126
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VLSID
2002
IEEE
16 years 1 months ago
2002
IEEE
An important class of problems used widely in both the embedded systems and scientific domains perform memory intensive computations on large data sets. These data sets get to be ...
131
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GI
2009
Springer
14 years 11 months ago
2009
Springer
Abstract: Model based testing promises systematic test coverage in a continuous testing process. However, in practice, model based testing struggles with informal specifications, d...
161
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ECRTS
2005
IEEE
15 years 7 months ago
2005
IEEE
Multiprocessor hardware platforms are now being considered for embedded systems, due to their high computational power and little additional cost when compared to single processor...