Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
The term neural network evolution usually refers to network topology evolution leaving the network's parameters to be trained using conventional algorithms. In this paper we ...
Ioannis G. Tsoulos, Dimitris Gavrilis, Euripidis G...
— Generating test data for Object-Oriented (OO) software is a hard task. Little work has been done on the subject, and a lot of open problems still need to be investigated. In th...
Background: Dekapentagonal maps depict the phylogenetic relationships of five genomes in a visually appealing diagram and can be viewed as an alternative to a single evolutionary ...
Abstract-- This study points out some weaknesses of existing Quantum-Inspired Evolutionary Algorithms (QEA) and explains in particular how hitchhiking phenomenons can slow down the...
Michael Defoin-Platel, Stefan Schliebs, Nikola Kas...