Sciweavers

    1623 search results - page 56 / 325
    » No Sorting
    Sort
    View
    191
    Voted
    LPAR
    2007
    Springer
    109views Automated Reasoning» more  LPAR 2007»
    Decidable Fragments of Many-Sorted Logic
    16 years 1 months ago
    Decidable Fragments of Many-Sorted Logic
    Download  www.cs.tau.ac.il
    We investigate the possibility of developing a decidable logic which allows expressing a large variety of real world specifications. The idea is to define a decidable subset of m...
    Aharon Abadi, Alexander Moshe Rabinovich, Mooly Sa...
    claim paper
    Read More »
    RTA
    2007
    Springer
    102views Theoretical Computer Science» more  RTA 2007»
    On the Completeness of Context-Sensitive Order-Sorted Specifications
    16 years 1 months ago
    On the Completeness of Context-Sensitive Order-Sorted Specifications
    Download  whoisjoe.info
    Joe Hendrix, José Meseguer
    claim paper
    Read More »
    STACS
    2007
    Springer
    86views Theoretical Computer Science» more  STACS 2007»
    Improved Online Algorithms for the Sorting Buffer Problem
    16 years 1 months ago
    Improved Online Algorithms for the Sorting Buffer Problem
    Download  www.cs.tau.ac.il
    Iftah Gamzu, Danny Segev
    claim paper
    Read More »
    TABLEAUX
    2007
    Springer
    105views Artificial Intelligence» more  TABLEAUX 2007»
    A Sequent Calculus for Bilattice-Based Logic and Its Many-Sorted Representation
    16 years 1 months ago
    A Sequent Calculus for Bilattice-Based Logic and Its Many-Sorted Representation
    Download  www.cs.st-andrews.ac.uk
    Ekaterina Komendantskaya
    claim paper
    Read More »
    DATE
    2006
    IEEE
    111views Hardware» more  DATE 2006»
    Extraction of defect density and size distributions from wafer sort test results
    16 years 1 months ago
    Extraction of defect density and size distributions from wafer sort test results
    Download  www.date-conference.com
    Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
    Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jas...
    claim paper
    Read More »
    Explore & Download
    Proceedings Preprints Top 5 Ranked Papers Publications Books Software Tutorials Presentations Lectures Notes Datasets
    Productivity Tools
    i2PDF i2Img i2Text i2OCR i2Symbol i2Type i2Speak i2Style i2Arabic i2Bopomo Latex Equation Editor
    Sciweavers
    About Community Cookies Privacy Policy Terms of Use

    Copyright © Sciweavers LLC, 2009-2026, USA.