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LPAR
2007
Springer
15 years 10 months ago
2007
Springer
We investigate the possibility of developing a decidable logic which allows expressing a large variety of real world specifications. The idea is to define a decidable subset of m...
RTA
2007
Springer
15 years 10 months ago
2007
Springer
STACS
2007
Springer
15 years 10 months ago
2007
Springer
109
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DATE
2006
IEEE
15 years 10 months ago
2006
IEEE
Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...