5924 search results - page 240 / 1185 » Normal Process Representatives |
158
Voted
DAC
2006
ACM
16 years 7 months ago
2006
ACM
Modern integrated circuits require careful attention to the soft-error rate (SER) resulting from bit upsets, which are normally caused by alpha particle or neutron hits. These eve...
180
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VLSID
2003
IEEE
16 years 6 months ago
2003
IEEE
Abstract-- In battery driven portable applications, the minimization of energy, average power, peak power, and peak power differential are equally important to improve reliability ...
197
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DSN
2009
IEEE
16 years 1 months ago
2009
IEEE
Critical infrastructures like the power grid are essentially physical processes controlled by electronic devices. In the last decades, these electronic devices started to be contr...
154
Voted
ICRA
2009
IEEE
16 years 1 months ago
2009
IEEE
— This paper presents a distributed version of our previous work, called SAFDetection, which is a sensor analysisbased fault detection approach that is used to monitor tightlycou...
146
Voted
IROS
2009
IEEE
16 years 1 months ago
2009
IEEE
Abstract— For ground vehicle localization, hybrid-GNSS localizers now use commonly dead-reckoning sensors, like odometers or inertial units. They are designed to increase the acc...