—As process technology shrinks devices, circuits experience accelerated wearout. Monitoring wearout will be critical for improving the efficiency of error detection and correctio...
This paper presents a systematic methodology to create customized structural macromodels for a specific analog circuit. The novel contributions of the method include definition of...
Current advances in chip design and manufacturing have allowed IC manufacturing to approach the nanometer range. As the feature size scales down, greater variability is experience...
Compare CMOS Logic with Pass-Transistor Logic, a question was raised in our mind: "Does any rule exist that contains all good?" This paper reveals novel logic synthesis ...
- One of the critical issues in MTCMOS design is how to estimate a circuit delay quickly. In this paper, we propose a delay modeling and static timing analysis (STA) methodology ta...