A key step for the effective use of local image features (i.e., highly distinctive and robust features) for recognition or image matching is the appropriate grouping of feature ma...
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...
Minimizing power consumption is one of the most important objectives in IC design. Resizing gates and assigning different Vt’s are common ways to meet power and timing budgets. ...
The study presented in this paper analyses descriptions extracted with MPEG-7-descriptors from visual content from the statistical point of view. Good descriptors should generate ...
We propose an approach to speeding up object detection, with an emphasis on settings where multiple object classes are being detected. Our method uses a segmentation algorithm to ...