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search results - page 40 / 677
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Observer-Conditioned-Observable Design Pattern
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ATS
2000
IEEE
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Hardware
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An adjacency-based test pattern generator for low power BIST design
15 years 2 months ago
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dit.upc.es
Patrick Girard, Loïs Guiller, Christian Landr...
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ITC
2000
IEEE
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Using on-chip test pattern compression for full scan SoC designs
15 years 2 months ago
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www.lirmm.fr
Helmut Lang, Jens Pfeiffer, Jeff Maguire
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TOOLS
2000
IEEE
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Programming Languages
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Statically Checked Documentation with Design Patterns
15 years 2 months ago
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www.csie.ntut.edu.tw
Aino Cornils, Görel Hedin
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APSEC
1999
IEEE
105
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Software Engineering
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A Source Code Generation Support System Using Design Pattern Documents Based on SGML
15 years 2 months ago
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www.scarpaz.com
Mika Ohtsuki, Akifumi Makinouchi, Norihiko Yoshida
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SAC
1999
ACM
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Applied Computing
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Multithreaded Rendezvous: A Design Pattern for Distributed Rendezvous
15 years 2 months ago
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Ricardo Jiménez-Peris, Marta Patiño-...
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