To save layout area for electrostatic discharge (ESD) protection design in the SOC era, test chip with large size NMOS devices placed under bond pads has been fabricated in 0.35-Â...
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
The dependencies and interrelations between classes and modules affect the maintainability of object-oriented systems. It is therefore important to capture weaknesses of the softw...
Microarchitectural prediction based on neural learning has received increasing attention in recent years. However, neural prediction remains impractical because its superior accur...
Hypertext-based user interfaces have become attractive for many distributed applications today, but they do not reach the usability level of window-based UIs. Because of insuffici...