3385 search results - page 582 / 677 » Observer-Conditioned-Observable Design Pattern |
139
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CCGRID
2006
IEEE
15 years 3 months ago
2006
IEEE
This paper presents the design and implementation of the MPI-IO interface for the Clusterfile parallel file system. The approach offers the opportunity of achieving a high corelat...
101
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COLCOM
2008
IEEE
15 years 3 months ago
2008
IEEE
Abstract. Traditional workflow enactment systems and workflow design processes view the workflow as a one-time interaction with the various data sources, executing a series of step...
101
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DELTA
2008
IEEE
15 years 3 months ago
2008
IEEE
Coupled transmission lines are experimentally characterised by using 4-port s-parameter measurements in the broad frequency band (up to more than the 20GHz). The test patterns are...
ECBS
2008
IEEE
15 years 3 months ago
2008
IEEE
While Architecture Description Languages (ADLs) have gained wide acceptance in the research community as a means of describing system designs, the uptake in industry has been slow...
EVOW
2008
Springer
15 years 3 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...