1721 search results - page 52 / 345 » On Active and Passive Testing |
102
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ICCD
2003
IEEE
15 years 3 months ago
2003
IEEE
Excessive switching activity during shift cycles in scan-based cores imposes considerable test power challenges. To ensure rapid and reliable test of SOCs, we propose a scan chain...
107
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CLUSTER
2006
IEEE
15 years 3 months ago
2006
IEEE
Most of today‘s HPC systems employ a single head node for control, which represents a single point of failure as it interrupts an entire HPC system upon failure. Furthermore, it...
ICPR
2010
IEEE
15 years 4 months ago
2010
IEEE
—A common computer vision task is navigation and mapping. Many indoor navigation tasks require depth knowledge of flat, unstructured surfaces (walls, floor, ceiling). With pass...
HAPTICS
2009
IEEE
14 years 7 months ago
2009
IEEE
This paper describes development of a wind display system for the TreadPort virtual environment locomotion interface, which is cumulatively known as the TreadPort Active Wind Tunn...
ASPDAC
2007
ACM
15 years 1 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...