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» On Applying Set Covering Models to Test Set Compaction
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HICSS
2003
IEEE
179views Biometrics» more  HICSS 2003»
15 years 3 months ago
JUMBL: A Tool for Model-Based Statistical Testing
Statistical testing of software based on a usage model is a cost-effective and efficient means to make inferences about software quality. In order to apply this method, a usage m...
Stacy J. Prowell
ISMVL
2005
IEEE
90views Hardware» more  ISMVL 2005»
15 years 3 months ago
Test Generation and Fault Localization for Quantum Circuits
It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wi...
Marek A. Perkowski, Jacob Biamonte, Martin Lukac
ICASSP
2009
IEEE
15 years 4 months ago
Posterior features applied to speech recognition tasks with user-defined vocabulary
This paper presents a novel approach for those applications where vocabulary is defined by a set of acoustic samples. In this approach, the acoustic samples are used as reference...
Guillermo Aradilla, Hervé Bourlard, Mathew ...
AIPR
2002
IEEE
15 years 2 months ago
ICA Mixture Model based Unsupervised Classification of Hyperspectral Imagery
Conventional remote sensing classification techniques that model the data in each class with a multivariate Gaussian distribution are inefficient, as this assumption is generally ...
Chintan A. Shah, Manoj K. Arora, Stefan A. Robila,...
PTS
2010
132views Hardware» more  PTS 2010»
14 years 8 months ago
Increasing Functional Coverage by Inductive Testing: A Case Study
This paper addresses the challenge of generating test sets that achieve functional coverage, in the absence of a complete specification. The inductive testing technique works by p...
Neil Walkinshaw, Kirill Bogdanov, John Derrick, Ja...