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» On Applying Set Covering Models to Test Set Compaction
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ITC
1994
IEEE
111views Hardware» more  ITC 1994»
15 years 1 months ago
Simulation Results of an Efficient Defect-Analysis Procedure
For obtaining a zero defect level, a high fault coverage with respect to the stuck-at fault model is often not sufficient as there are many defects that show a more complex behavi...
Olaf Stern, Hans-Joachim Wunderlich
ATAL
2008
Springer
14 years 11 months ago
Coalitional skill games
We consider Coalitional Skill Games (CSGs), a simple model of cooperation among agents. This is a restricted form of coalitional games, where each agent has a set of skills that a...
Yoram Bachrach, Jeffrey S. Rosenschein
ISSTA
2006
ACM
15 years 3 months ago
Coverage metrics for requirements-based testing
In black-box testing, one is interested in creating a suite of tests from requirements that adequately exercise the behavior of a software system without regard to the internal st...
Michael W. Whalen, Ajitha Rajan, Mats Per Erik Hei...
ISQED
2002
IEEE
203views Hardware» more  ISQED 2002»
15 years 2 months ago
Automatic Test Program Generation from RT-Level Microprocessor Descriptions
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
3DPVT
2006
IEEE
174views Visualization» more  3DPVT 2006»
15 years 3 months ago
Two Stage View Planning for Large-Scale Site Modeling
We present a systematic view planning method to assist construction of 3-D models of large outdoor sites using a mobile robot platform with mounted scanner. In the first stage, w...
Paul Blaer, Peter K. Allen