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VLSID
2006
IEEE
15 years 3 months ago
2006
IEEE
As the IC process technology scales, the oxide thickness and operating voltage continues to decrease. The gate oxide thickness in recent and future IC process technology has appro...
VLSID
2006
IEEE
15 years 3 months ago
2006
IEEE
This tutorial focuses on advanced techniques to cope with the complexity of designing modern digital chips which are complete systems often containing multiple processors, complex...
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WIOPT
2006
IEEE
15 years 3 months ago
2006
IEEE
— This paper develops a novel color-based broadcast scheme for wireless ad hoc networks where each forwarding of the broadcast message is assigned a color from a given pool of co...
CASES
2006
ACM
15 years 3 months ago
2006
ACM
With advances in process technology, soft errors (SE) are becoming an increasingly critical design concern. Due to their large area and high density, caches are worst hit by soft ...
COMPGEOM
2006
ACM
15 years 3 months ago
2006
ACM
We consider a class of geometric facility location problems in which the goal is to determine a set X of disks given by their centers (tj) and radii (rj) that cover a given set of...