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DDECS
2007
IEEE
90views Hardware» more  DDECS 2007»
15 years 4 months ago
Test Pattern Generator for Delay Faults
A method of generating test pairs for the delay faults is presented in this paper. The modification of the MISR register gives the source of test pairs. The modification of this r...
Tomasz Rudnicki, Andrzej Hlawiczka
ECOOPW
2007
Springer
15 years 4 months ago
Enabling Software Evolution Via AOP and Reflection
Following last three years' RAM-SE (Reflection, AOP and Meta-Data for Software Evolution) workshop at the ECOOP conference, the RAM-SE'07 workshop was a successful and po...
Manuel Oriol, Walter Cazzola, Shigeru Chiba, Gunte...
ATAL
2006
Springer
15 years 4 months ago
Verifying space and time requirements for resource-bounded agents
The effective reasoning capability of an agent can be defined as its capability to infer, within a given space and time bound, facts that are logical consequences of its knowledge...
Natasha Alechina, Mark Jago, Piergiorgio Bertoli, ...
ECOOPW
2006
Springer
15 years 4 months ago
AOSD and Reflection: Benefits and Drawbacks to Software Evolution
Following last two years' RAM-SE (Reflection, AOP and Meta-Data for Software Evolution) workshop at the ECOOP conference, the RAM-SE 2006 workshop was a successful and popular...
Walter Cazzola, Shigeru Chiba, Yvonne Coady, Gunte...
EMSOFT
2006
Springer
15 years 4 months ago
Compiler-assisted leakage energy optimization for clustered VLIW architectures
Miniaturization of devices and the ensuing decrease in the threshold voltage has led to a substantial increase in the leakage component of the total processor energy consumption. ...
Rahul Nagpal, Y. N. Srikant