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FTCS
1997
15 years 1 months ago
1997
In this paper the consolidate identification of faults, distinguished as transient or permanent/intermittent, is approached. Transient faults discrimination has long been performe...
DFT
2005
IEEE
15 years 5 months ago
2005
IEEE
Detection of defective pixels that develop on-line is a vital part of fault tolerant schemes for repairing imagers during operation. This paper presents a new algorithm for the id...
ISMVL
2007
IEEE
15 years 6 months ago
2007
IEEE
The clock rate of modern chips is still increasing and at the same time the gate size decreases. As a result, already slight variations during the production process may cause a f...
ISSTA
2004
ACM
15 years 5 months ago
2004
ACM
The ability to predict which files in a large software system are most likely to contain the largest numbers of faults in the next release can be a very valuable asset. To accomp...
DATE
1998
IEEE
15 years 4 months ago
1998
IEEE
Most memory test algorithms are optimized tests for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e....