4451 search results - page 90 / 891 » On Random Ordering Constraints |
135
click to vote
VTS
2008
IEEE
15 years 10 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
126
click to vote
ESANN
2000
15 years 5 months ago
2000
It has been shown that self-organized maps, when adequately trained with the set of integers 1 to 32, lay out real numbers in a 2D map in an ordering that is superior to any of the...
129
click to vote
ICST
2010
IEEE
15 years 2 months ago
2010
IEEE
—A random testing strategy can be effective at finding faults, but may leave some routines entirely untested if it never gets to call them on objects satisfying their preconditi...
124
click to vote
PODS
2006
ACM
16 years 4 months ago
2006
ACM
Recently, there has been an increased focus on modeling uncertainty by distributions. Suppose we wish to compute a function of a stream whose elements are samples drawn independen...
133
click to vote
EUROPAR
2009
Springer
15 years 8 months ago
2009
Springer
We consider a multi-processor system-on-chip destined for streaming applications. An application is composed of one input and one output queue and in-between, several levels of ide...