In this paper, we consider a variation of the Euclidean Steiner Tree Problem in which the space underlying the set of nodes has a specified non-uniform cost structure. This proble...
This paper addresses the problem of mapping images between different vision sensors. Such a mapping could be modeled as a sampling problem that has to encompass the change of geom...
We study the connection between higher order total variation (TV) regularization and support vector regression (SVR) with spline kernels in a one-dimensional discrete setting. We p...
Double patterning lithography (DPL) is a likely resolution enhancement technique for IC production in 32nm and below technology nodes. However, DPL gives rise to two independent, ...
Efficient and accurate fitting of Active Appearance Models (AAM) is a key requirement for many applications. The most efficient fitting algorithm today is Inverse Compositiona...