123 search results - page 16 / 25 » On Statistical Timing Analysis with Inter- and Intra-Die Var... |
GLVLSI
2006
IEEE
15 years 3 months ago
2006
IEEE
Process variations have become a key concern of circuit designers because of their significant, yet hard to predict impact on performance and signal integrity of VLSI circuits. St...
DAC
2006
ACM
15 years 10 months ago
2006
ACM
Existing approaches to timing analysis under uncertainty are based on restrictive assumptions. Statistical STA techniques assume that the full probabilistic distribution of parame...
ISQED
2002
IEEE
15 years 2 months ago
2002
IEEE
This paper presents a methodology for the statistical analysis of clock tree structures. It allows to accurately predict and analyze the impact of process variation on clock skew....
ICCAD
2006
IEEE
15 years 6 months ago
2006
IEEE
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
ICST
2009
IEEE
15 years 4 months ago
2009
IEEE
Vulnerability discovery rates need to be taken into account for evaluating security risks. Accurate projection of these rates is required to estimate the effort needed to develop ...