123 search results - page 6 / 25 » On Statistical Timing Analysis with Inter- and Intra-Die Var... |
ICCAD
2005
IEEE
15 years 6 months ago
2005
IEEE
Based on a timing yield model, a statistical static timing analysis technique is proposed. This technique preserves existing methodology by selecting a “device file setting” ...
ICCAD
2007
IEEE
15 years 6 months ago
2007
IEEE
While the increasing need for addressing process variability in sub-90nm VLSI technologies has sparkled a large body of statistical timing and optimization research, the realizati...
73
Voted
ASPDAC
2010
ACM
14 years 7 months ago
2010
ACM
Level-sensitive transparent latches are widely used in high-performance sequential circuit designs. Under process variations, the timing of a transparently latched circuit will ada...
DATE
2005
IEEE
15 years 3 months ago
2005
IEEE
— State of the art statistical timing analysis (STA) tools often yield less accurate results when timing variables become correlated due to global source of variations and path r...
71
Voted
DAC
2004
ACM
15 years 10 months ago
2004
ACM
timing analysis tools to replace standard deterministic static timing analyzers whereas [8,27] develop approaches for the statistical estimation of leakage power considering within...