3090 search results - page 177 / 618 » On Testing Answer-Set Programs |
136
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ICS
1993
Tsinghua U.
15 years 9 months ago
1993
Tsinghua U.
—Data dependence analysis techniques are the main component of today’s strategies for automatic detection of parallelism. Parallelism detection strategies are being incorporate...
171
Voted
ETS
2010
IEEE
15 years 6 months ago
2010
IEEE
Testing of 3D stacked ICs (SICs) is becoming increasingly important in the semiconductor industry. In this paper, we address the problem of test architecture optimization for 3D s...
139
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ICSE
2008
IEEE-ACM
16 years 5 months ago
2008
IEEE-ACM
Fault-localization techniques that utilize information about all test cases in a test suite have been presented. These techniques use various approaches to identify the likely fau...
138
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HVC
2005
Springer
15 years 10 months ago
2005
Springer
Non-determinism is a serious impediment to testing and debugging concurrent programs. Such programs do not execute the same way each time they are run, which can hide the presence ...
150
Voted
TLCA
1993
Springer
15 years 9 months ago
1993
Springer
This paper describes formalizations of Tait’s normalization proof for the simply typed λ-calculus in the proof assistants Minlog, Coq and Isabelle/HOL. From the formal proofs p...