1529 search results - page 19 / 306 » On Timing Analysis of Combinational Circuits |
DATE
2010
IEEE
14 years 9 months ago
2010
IEEE
—The advanced sampling and variance reduction techniques as efficient alternatives to the slow crude-MC method have recently been adopted for the analysis of timing yield in dig...
ICCAD
2003
IEEE
15 years 2 months ago
2003
IEEE
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
ITC
2003
IEEE
15 years 2 months ago
2003
IEEE
A scalable laser-based timing analysis technique we call laser assisted device alteration (LADA) is introduced for the rapid isolation and analysis of defect-free performance limi...
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...
DAC
2005
ACM
15 years 10 months ago
2005
ACM
Recent study shows that the existing first order canonical timing model is not sufficient to represent the dependency of the gate delay on the variation sources when processing an...