1529 search results - page 33 / 306 » On Timing Analysis of Combinational Circuits |
76
Voted
DAC
2005
ACM
14 years 11 months ago
2005
ACM
Variability of process parameters makes prediction of digital circuit timing characteristics an important and challenging problem in modern chip design. Recently, statistical stat...
90
Voted
DAC
2004
ACM
15 years 10 months ago
2004
ACM
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...
ICCD
2000
IEEE
15 years 6 months ago
2000
IEEE
This paper is concerned with the analysis and optimization of the ground bounce in digital CMOS circuits. First, an analytical method for calculating of the ground bounce is presen...
CVPR
2003
IEEE
15 years 11 months ago
2003
IEEE
Visual Hull (VH) construction from silhouette images is a popular method of shape estimation. The method, also known as Shape-From-Silhouette (SFS), is used in many applications s...