Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
To efficiently analyze the large-scale interconnect dominant circuits with inductive couplings (mutual inductances), this paper introduces a new state matrix, called VNA, to stamp ...
Hao Yu, Chunta Chu, Yiyu Shi, David Smart, Lei He,...
Applications in computer networks often require high throughput access to large data structures for lookup and classification. While advanced algorithms exist to speed these search...
This paper proposes a new bipatition-codec architecture that may reduce power consumption of pipelined circuits. We treat each output value of a pipelined circuit as one state of ...
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
Michael Kishinevsky, Alex Kondratyev, Luciano Lava...