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» On Timing Analysis of Combinational Circuits
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FPGA
2007
ACM
142views FPGA» more  FPGA 2007»
15 years 3 months ago
Parametric yield in FPGAs due to within-die delay variations: a quantitative analysis
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
N. Pete Sedcole, Peter Y. K. Cheung
TVLSI
2010
14 years 4 months ago
Fast Analysis of a Large-Scale Inductive Interconnect by Block-Structure-Preserved Macromodeling
To efficiently analyze the large-scale interconnect dominant circuits with inductive couplings (mutual inductances), this paper introduces a new state matrix, called VNA, to stamp ...
Hao Yu, Chunta Chu, Yiyu Shi, David Smart, Lei He,...
TVLSI
2008
139views more  TVLSI 2008»
14 years 9 months ago
Ternary CAM Power and Delay Model: Extensions and Uses
Applications in computer networks often require high throughput access to large data structures for lookup and classification. While advanced algorithms exist to speed these search...
Banit Agrawal, Timothy Sherwood
ICCAD
1999
IEEE
89views Hardware» more  ICCAD 1999»
15 years 2 months ago
A bipartition-codec architecture to reduce power in pipelined circuits
This paper proposes a new bipatition-codec architecture that may reduce power consumption of pipelined circuits. We treat each output value of a pipelined circuit as one state of ...
Shanq-Jang Ruan, Rung-Ji Shang, Feipei Lai, Shyh-J...
ICCAD
1997
IEEE
144views Hardware» more  ICCAD 1997»
15 years 2 months ago
Partial scan delay fault testing of asynchronous circuits
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
Michael Kishinevsky, Alex Kondratyev, Luciano Lava...