— In this paper, we study the problem of delay defect diagnosis based on statistical timing models. We propose a diagnosis algorithm that can effectively utilize statistical timi...
Abstract--In this paper, we present a new approach to calculate the steady state resistance values for CMOS library gates. These resistances are defined as simple equivalent models...
Abstract — This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect d...
An area efficient and robust integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstructi...
Mohamed Hafed, Nazmy Abaskharoun, Gordon W. Robert...
—CMOS radio receiver architectures, based on radio frequency (RF) sampling followed by discrete-time (D-T) signal processing via switched-capacitor circuits, have recently been p...