1529 search results - page 84 / 306 » On Timing Analysis of Combinational Circuits |
ITC
2003
IEEE
15 years 3 months ago
2003
IEEE
Multiple-detect test sets have been shown to be effective in lowering defect level. Other researchers have noted that observing the effects of a defect can be controlled by sensit...
WCET
2010
14 years 7 months ago
2010
Safe and tight worst-case execution times (WCETs) are important when scheduling hard realtime systems. This paper presents METAMOC, a modular method, based on model checking and s...
WSC
2007
15 years 4 days ago
2007
This paper is motivated by a case study performed at a company that manufactures two main types of customized products. In an effort to significantly increase their throughput cap...
DAC
2007
ACM
15 years 10 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
WCET
2007
14 years 11 months ago
2007
Memory corruption is one of the most common software failures. For sequential software and multitasking software with synchronized data accesses, it has been shown that program fa...