9581 search results - page 1825 / 1917 » On Ubiquitous Integrated Computing |
DAC
2002
ACM
15 years 11 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
DAC
2002
ACM
15 years 11 months ago
2002
ACM
The design of high-throughput large-state Viterbi decoders relies on the use of multiple arithmetic units. The global communication channels among these parallel processors often ...
DAC
2002
ACM
15 years 11 months ago
2002
ACM
For present-day micro-electronic designs, it is becoming ever more important to accurately model substrate coupling effects. Basically, either a Finite Element Method (FEM) or a B...
DAC
2003
ACM
15 years 11 months ago
2003
ACM
Power dissipation is becoming the most challenging design constraint in nanometer technologies. Among various design implementation schemes, standard cell ASICs offer the best pow...
DAC
2004
ACM
15 years 11 months ago
2004
ACM
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...